Related information


A-Probe Guide
What is A-Probe?
How it works?
What can be done?

Magnetic Force (preliminary test)

Use in SEM

Quasi contact mode

Akiyama-Probe Gallery

EMPA Switzerland
Dr. Vinzenz Friedli, “Focused electron- and ion-beam induced processes :
in situ monitoring, analysis and modeling,” disseration EPFL, no 4036
(2008).
Akiyama-Probe in SEM
Institute of Microtechnology, University of Neuchâtel, Switzerland
on Veeco Nanoscope III, with Nanosurf easyPLL
Akiyama-Probe vs. Optical lever
A-Probe Std. 40 N/m Si lever, Tapping mode
Akiyama-Probe Std. 40 N/m Si lever, Tapping mode
Nanosurf AG, Switzerland
Nanite A100 A-Probe AFM
Topographic images taken under ambient conditions in intermittent
contact mode using Akiyama-Probe with Nanosurf Nanite A100 A-Probe AFM
Carbon nanotube Staphylococcus aureus bacteria
Carbon nanotube Staphylococcus aureus bacteria
Atomic steps on PbSnSe etch pits
Atomic steps on PbSnSe
etch pits
Research Institute of Biomolecule Metrology Co., Ltd., Japan
SXM Standard
Topographic images taken under ambient conditions in intermittent
contact mode using Akiyama-Probe with : SXM Standard
(Research Institute of Biomolecule Metrology Co., Ltd., Japan)
Institute of Microtechnology, University of Neuchâtel, Switzerland on Veeco Nanoscope III, with Nanosurf easyPLL
Samples from Nanosurf AG.
IC chip (40 µm x 40 µm) Carbon nanotube (5 µm x 5 µm)
IC chip (40 µm x 40 µm) Carbon nanotube (5 µm x 5 µm)
PS/PMMA film (5 µm x 5 µm)
PS/PMMA film (5 µm x 5 µm) Glass beads (4 µm x 4 µm)